High Resolution X-Ray Diffractometry And Topography

High Resolution X-Ray Diffractometry And Topography
Author :
Publisher : CRC Press
Total Pages : 263
Release :
ISBN-10 : 9780203979198
ISBN-13 : 0203979192
Rating : 4/5 (192 Downloads)

Book Synopsis High Resolution X-Ray Diffractometry And Topography by : D.K. Bowen

Download or read book High Resolution X-Ray Diffractometry And Topography written by D.K. Bowen and published by CRC Press. This book was released on 1998-02-05 with total page 263 pages. Available in PDF, EPUB and Kindle. Book excerpt: The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization


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