Characterization of the Micromechanical Properties of Refractory Thin Films Via Synchrotron X-ray Topography
| Author | : Waiman Ng |
| Publisher | : |
| Total Pages | : 178 |
| Release | : 1986 |
| ISBN-10 | : OCLC:19047487 |
| ISBN-13 | : |
| Rating | : 4/5 ( Downloads) |
Book Synopsis Characterization of the Micromechanical Properties of Refractory Thin Films Via Synchrotron X-ray Topography by : Waiman Ng
Download or read book Characterization of the Micromechanical Properties of Refractory Thin Films Via Synchrotron X-ray Topography written by Waiman Ng and published by . This book was released on 1986 with total page 178 pages. Available in PDF, EPUB and Kindle. Book excerpt:
