Advanced Processing and Characterization Technologies

Advanced Processing and Characterization Technologies
Author :
Publisher : American Institute of Physics
Total Pages : 252
Release :
ISBN-10 : UCAL:B4402699
ISBN-13 :
Rating : 4/5 ( Downloads)
DOWNLOAD EBOOK
Book Synopsis Advanced Processing and Characterization Technologies by : Holloway

Download or read book Advanced Processing and Characterization Technologies written by Holloway and published by American Institute of Physics. This book was released on 1991 with total page 252 pages. Available in PDF, EPUB and Kindle. Book excerpt:


Advanced Processing and Characterization Technologies Related Books

Advanced Processing and Characterization Technologies
Language: en
Pages: 252

Advanced Processing and Characterization Technologies

Authors: Holloway
Categories: Science
Type: BOOK - Published: 1991 - Publisher: American Institute of Physics

DOWNLOAD EBOOK

Optical Characterization of Epitaxial Semiconductor Layers
Language: en
Pages: 446

Optical Characterization of Epitaxial Semiconductor Layers

Authors: Günther Bauer
Categories: Technology & Engineering
Type: BOOK - Published: 2012-12-06 - Publisher: Springer Science & Business Media

DOWNLOAD EBOOK

The characterization of epitaxial layers and their surfaces has benefitted a lot from the enormous progress of optical analysis techniques during the last decad
Epitaxy of Semiconductors
Language: en
Pages: 546

Epitaxy of Semiconductors

Authors: Udo W. Pohl
Categories: Technology & Engineering
Type: BOOK - Published: 2020-07-20 - Publisher: Springer Nature

DOWNLOAD EBOOK

The extended and revised edition of this textbook provides essential information for a comprehensive upper-level graduate course on the crystalline growth of se
Metalorganic Vapor Phase Epitaxy (MOVPE)
Language: en
Pages: 582

Metalorganic Vapor Phase Epitaxy (MOVPE)

Authors: Stuart Irvine
Categories: Technology & Engineering
Type: BOOK - Published: 2019-10-07 - Publisher: John Wiley & Sons

DOWNLOAD EBOOK

Systematically discusses the growth method, material properties, and applications for key semiconductor materials MOVPE is a chemical vapor deposition technique
In Situ Characterization of Thin Film Growth
Language: en
Pages: 295

In Situ Characterization of Thin Film Growth

Authors: Gertjan Koster
Categories: Technology & Engineering
Type: BOOK - Published: 2011-10-05 - Publisher: Elsevier

DOWNLOAD EBOOK

Advanced techniques for characterizing thin film growth in situ help to develop improved understanding and faster diagnosis of issues with the process. In situ
Copyright Health Wealth Mirror
Pinnacle Themes