The International Symposium for Testing and Failure Analysis (ISTFA) 2018 is co-located with the International Test Conference (ITC) 2018, October 28 to Novembe

The theme for the 2019 conference is Novel Computing Architectures. Papers will include discussions on the advent of Artificial Intelligence and the promise of

The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM I

This book offers a comprehensive reference guide for graduate students and professionals in both academia and industry, covering the fundamentals, architecture,

This book provides an overview of emerging topics in the field of hardware security, such as artificial intelligence and quantum computing, and highlights how t