Design and Performance of an Infrared Spectroscopic Ellipsometer/reflectometer for Thin-film Characterization
Author | : Michael Scott Thomas |
Publisher | : |
Total Pages | : 188 |
Release | : 1996 |
ISBN-10 | : OCLC:36958424 |
ISBN-13 | : |
Rating | : 4/5 ( Downloads) |
Book Synopsis Design and Performance of an Infrared Spectroscopic Ellipsometer/reflectometer for Thin-film Characterization by : Michael Scott Thomas
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