Nanoscale Stresses Simulation and Characterization of Deep Sub-micron Semiconductor Devices

Nanoscale Stresses Simulation and Characterization of Deep Sub-micron Semiconductor Devices
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Total Pages : 410
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ISBN-10 : UVA:X030123239
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Book Synopsis Nanoscale Stresses Simulation and Characterization of Deep Sub-micron Semiconductor Devices by : Jian Li

Download or read book Nanoscale Stresses Simulation and Characterization of Deep Sub-micron Semiconductor Devices written by Jian Li and published by . This book was released on 2006 with total page 410 pages. Available in PDF, EPUB and Kindle. Book excerpt:


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